Skip to main content »

Trinity College Dublin

MTG Homepage
Microelctronics Technology Group
MTG Homepage Research People Collaboration Laboratory Facilities Educational Activities
 

Alan Moore

Personal Details | Research | Publications

 

Personal Details

Occupation: MTG Director/Senior Lecturer

Telephone: 353 1 6081738
Fax: 353 1 6772442

Click here to send an email >>




Alan Moore, MTG Director/Senior Lecturer

Qualifications

Alan Moore received a B.Sc. degree in Engineering from Queen’s University, Belfast in 1974. His research on Oxide-Passivated BARITT Microwave Devices led to the award of the degree of Ph.D. in 1978. In 1980 he was appointed lecturer in Microelectronics Science at Trinity College Dublin. Since 1987 he has been a Senior Lecturer in the Department of Electronic and Electrical Engineering at TCD. During his career he has spent sabbatical periods at CNET, Grenoble, and at LETI, Grenoble. He has represented TCD on Examination Boards, Course Review Boards and Interview Panels at DIT. He is Director of the Microelectronics Technology Group (MTG).

Research Interests

Alan Moore’s research interests have spanned a wide range of topics including Resonant Inductive Plasma Etching, Study of Defects in SOI Material, and Fabrication of Ultra-shallow Junctions using Proximity Rapid Thermal Diffusion. More recently, research has focused on the characterisation of a range of semiconducting materials using spectroscopic techniques such as micro-Raman and FTIR. Dr. Moore has contributed to more than 80 publications in scientific journals and international conferences.

Publications

Referred Articles

1. S. Balakrishnan, A. Rafferty, T.S. Perova, Y.K. Guníko and R.A. Moore, "Investigations of rare earth doped nanocomposite of macro-porous silicon", Semicond.Sci.Technol. (in preparation).

2. V. Baranov, T. S. Perova, S. Solosin, R. A. Moore, A. V. Fedorov, V. Yam, V. Le Thanh and D. Bouchier, Polarized Raman spectroscopy of multilayer Ge/Si(001) quantum dot heterostructures, J.Appl.Phys. 96, N5, (submitted).

3. I.I. Shaganov, T.S. Perova, R.A. Moore and K. Berwick, The effect of the internal field on the absorption spectra of nanoparticles in 3D, 2D and 1D size confinement, J.Phys.Chem. (received 11 August 2004, MS Number JP040543L).

4. T.S. Perova, C. Beitia, M. Nolan, R.A. Moore, J. McGilp and H. Gamble, Borosilicate Glass as a Spin-on Dopant Source: FTIR and Spectroscopic Ellipsometry Investigations, (submitted).

5. D. Fitzgerald, T.S. Perova, R.A. Moore, K. Lyutovich, M. Oehme, and E. Kasper, Strain, composition and crystalline disorder in thin SiGe layers studied by Raman spectroscopy, J. Microstruct. (in press).

6. J.McCarthy, S. Bhattacharya, T.S. Perova, R.A. Moore, F. Meyer, H. Gamble, and B. M. Armstrong, Composition and stress analysis in Si structures using micro-Raman spectroscopy, J. Microstruct. (in press).

7. K.Hosie, T.S. Perova, R.A. Moore, E. Roos, K. Berreth and A. Lyutovich, Micro-Raman spectroscopy of protective coatings deposited onto C/C-SiC composites, J. Microstruct. (in press).

8. S. Bhattacharya, S. K. Samanta, S. Chatterjee, John McCarthy, B. M. Armstrong, H. S. Gamble, C. K. Maiti, T. Perova and R.A. Moore, High-k ZrO2 gate dielectric on strained-Si, MRS Proceedings, 2004 (in press).

9. K. Maile, K. Berreth, A. Lyutovich, G. Zies, R. Weiss, T. Perova and R.A. Moore, Chemical vapour deposition of pyC-SixCy-SiC-Si3N4 multilayer with graded C...SiC transition, Material Sci. and Engeneering, Surface and Coatings Technology, 180-181, 465-469.

10. R.A. Moore, S. Unnikrishnan, T.S. Perova, N.D. McMillan, S. Riedel, M. OíNeill and G. Doyle, Investigation of correlation between characteristics of Raman spectra and parameters of data-scattering obtained from phase coherence theory, J. Microstruct. (in press).

11. E.V.Astrova, T.S. Perova, V. Tolmachev, A.D. Remenyuk, J.K. Vij and R.A. Moore, Large Optical Anisotropy of 1D Photonic Crystal Fabricated by Vertical Etching of Silicon, in book: Physics, Chemistry and Application of Nanostructures, Eds. V.E. Borisenko, S.V. Gaponenko and V.S. Gurin, World Scientific, 2003, pp.88-91.

12. Baranov, Yu. P. Rakovich, and J. F. Donegan, T. S. Perova and R.A. Moore D.V. Talapin, A.L. Rogach, Y.Masumoto, and I. Nabiev, Effect of ZnS shell thickness on the phonon spectra in CdSe quantum dots, Phys.Rev.B, 68, N 16, 165306/1-7 (2003).

13. E.V. Astrova, T.S. Perova, V.A. Tolmachev, A.D. Remenyuk, J.K. Vij and R.A. Moore, The Infrared Birefringes of Artificial Crystal Obtained by Anisotropic Etching of Silicon, Semiconductors, 37, N 4, 399-403 (2003).

14. T.S. Perova, K. Maile, A. Lyutovich, K. Berreth, D. Potapova, and R.A. Moore, Investigation into the structure and composition of Carbon/Carbon-SiC Composites, SPIE, 4876, pp.758-770 (2003).

15. John F. Donegan, Yury Rakovich, Lisong Yang, Eithne M. McCabe, Tania Perova, R.A Moore, Whispering gallery mode lasing from a composite system of CdTe nanocrystals and a spherical microcavity, Semicond. Sci. Techn., 18, 914-918 (2003).

16. T.S. Perova, F. Meyer, M. Hattab, D. Potapova, and R.A. Moore, Carbon Dependence of the Vibrational Modes Frequencies in Si1-x-yGexCy Alloys, SPIE, 4876, pp. 605-615 (2003).

17. Baranov, T. S. Perova, R.A. Moore, Yu. P. Rakovich, J. F. Donegan, and D. Talapin, "Evolution of optical phonons in CdSe/ZnS quantum dots: Raman spectroscopy", in book: Physics, Chemistry and Application of Nanostructures, Eds. V.E. Borisenko, S.V. Gaponenko and V.S. Gurin, World Scientific, 2003, pp.132-135.

18. John F. Donegan, Yury Rakovich, Lisong Yang, Eithne M. McCabe, Tania Perova, R.A. Moore, Whispering gallery mode lasing from a composite system of CdTe nanocrystals and a spherical microcavity, Semicon. Sci. Techn., 18, 914-918 (2003).

19. Baranov, Yu. P. Rakovich, and J. F. Donegan, T. S. Perova and R.A. Moore D.V. Talapin, A.L. Rogach, Y.Masumoto, and I. Nabiev, Effect of ZnS shell thickness on the phonon spectra in CdSe quantum dots, Phys.Rev.B, 68, N 16, 165306/1-7 (2003).

20. A. V. Baranov, T. S. Perova, S. Solosin, R. A. Moore, V. Yam, V. Le Thanh, and D. Bouchier, Polarized Raman spectroscopy of single layer and multilayer Ge/Si(001) quantum dot heterostructures, in Frontiers in Molecular-Scale Science and Technology of Nanocarbon, NanoSilicon and Biopolymer Multifunctional Nanosystems, Eds. E. Buzaneva and P. Scharff, pp. 133-148, 2003, Kluwer Academic Publishers. Printed in the Netherlands.

21. V. A. Tolmachev, T.S. Perova, E.V. Astrova and R.A. Moore, Photonic band gap structures based on periodically grooved silicon, in Book of ICTONí03 Conference Proceedings, vol. 1, pp. 243-246 (2003).

22. T.S. Perova, E.V.Astrova, R. Maurice, D. Potapova, T.N. Vasunkina, and R.A. Moore, Characterisation of Macro-porous Silicon for Electronic Applications, SPIE, v. 4876, pp.396-404 (2003).

23. Y. K. Guníko, T. S. Perova, S. Balakrishnan, D. A. Potapova, R.A. Moore and E. V. Astrova, Spectroscopic Characterisation of Chemically Modified Porous Silicon, SPIE, v. 4876, pp.788-896 (2003).

24. Cormac Moore, Tatiana Perova, Barry Kennedy, Kevin Berwick, Igor Shaganov, and R.A. Moore, Study of Structure and Quality of Different Silicon Oxides using FTIR and Raman Microscopy, SPIE, 4876, pp.1247-1257 (2003).

25. Vladimir Tolmachev, Tatiana Perova, Jagdish Vij, Ekaterina Astrova, Kevin Berwick and R.A. Moore, FTIR and Raman Investigation of Vertically Etched Silicon as 1-D Photonic Crystal, SPIE, 4876, pp.196-206 (2003)

26. Igor Shaganov, Tatiana Perova, Kevin Berwick, and R.A. Moore, Local Field Effect on Infrared Phonon Frequencies of Thin Dielectric Films, SPIE, 4876, pp.1158-1168 (2003).

27. K. Guníko, T. S. Perova, S. Balakrishnan, D. A. Potapova, R. A. Moore and E. V. Astrova, Chemical Modification of Silicon Surfaces with Ferrocene Functionalities, Physics Status Solidi (a), 197, N2, 492-496 (2003).

28. TS Perova, R Maurice, K Lyutovich, M Bauer, CP Parry, E Kasper and RA Moore, Micro-Raman investigations of thin SiGe buffer layers with high Ge content, J.Mater.Sci.:Mater.Electr., 14, N 5, pp.441-444 (2003).

29. T.S. Perova, K. Lyutovich, D. Potapova, C.P. Parry, E. Kasper and R.A. Moore, Strain and composition in thin SiGe buffer layers with high Ge content studied by micro-Raman spectroscopy, Proceedings of the 4th International Conference on Advanced Semiconductor Devices and Microsystems, Smolenice Castle, Slovakia, 14-16 October, 2002, pp. 191-194.

30. T.S. Perova, C. Moore, I.I. Shaganov, K. Berwick, D. Potapova and R.A. Moore, Study of Structure and Quality of Different Silicon Oxides by using FTIR Spectroscopy, Book of Pre-Prints of the 4th International Conference on Materials for Microelectronics and Nanoengineering, 10-12 June 2002 Helsinki, Finland. Published by IOM Communications Ltd., London SW1Y 5DB, UK, pp.303-306, 2002.

31. D. Lowney, T.S. Perova, M. Nolan, P.J. McNally, R.A. Moore, H.S. Gamble, T. Tuomi, R. Rantamaki, and A.N. Danilewsky, Investigation of Strain-Induced Effects in Silicon Wafers due to Proximity Rapid Thermal Processing using Micro-Raman Spectroscopy and Synchrotron X-Ray Topography, Semicond. Sci. Techn., 17, 1081-1089 (2002).

32. T.A. Briantseva, Z.M. Lebedeva, D.V. Lioubtchenko, M. Nolan, T.S. Perova, R.A. Moore and K. Berwick, Precise Chemical Analysis Development for Si and GaAs Surfaces, J.Material Science: Materials in Electronics, 13, N 6, 315-318, 2002.

33. T.S. Perova, R. Maurice, K. Lyutovich, M. Bauer, C.P. Parry, E. Kasper and R.A. Moore, Micro-Raman Investigations of Thin SiGe Buffer Layers with high Ge Content, Book of Pre-Prints of the 4th International Conference on Materials for Microelectronics and Nanoengineering, 10-12 June 2002, Helsinki, Finland. Published by IOM Communications Ltd., London SW1Y 5DB, UK, pp.141-144, 2002.

34. P.C. Fannin, T.S. Perova, M. Nolan, T. Giannitis, R.A. Moore and H.S. Gamble, Dielectric Properties of Thin Solid Films formed on Silicon, J.Material Science: Materials in Electronics, 12, 347-350 (2001).

35. I.I. Shaganov, T.S. Perova, R.A. Moore and K. Berwick, Spectroscopic characterisation of SiO and SiO2 solid films: Assignment and local field influence, J.Material Science: Materials in Electronics, 12, 351-355 (2001).

36. T.A. Briantseva, Z.M. Lebedeva, D.V. Lioubtchenko, I.A. Markov, M. Nolan, T.S. Perova, R.A. Moore, Precise chemical analysis development for silicon wafers after rapid thermal processing, Applied Surface Science, 156, N1-4, 21-25 (2000).

37. I.I. Shaganov, T.S. Perova, R.A. Moore and K. Berwick, The Influence of the Local Field Effect on the Spectroscopic Characteristics of SiO2 Solid Films, Book of Pre-Prints of the 3rd International Conference on Materials for Microelectronics, 16-17 October 2000, Dublin Castle, Ireland, pp.263-266.

38. P.C. Fannin, T.S. Perova, M. Nolan, T. Giannitis, R.A. Moore and H.S. Gamble, Dielectric Properties of Thin Solid Films formed on Silicon, Book of Pre-Prints of the 3rd International Conference on Materials for Microelectronics, 16-17 October 2000, Dublin Castle, Ireland, pp. 259-262.

39. M. Nolan, D. Lowney, P.J. McNally, T.S. Perova, R.A. Moore, H.S. Gamble, T. Tuomi, R. Rantamaki, A.N. Danilewsky, Synchrotron X-Ray Topography And Micro-Raman Spectroscopy of Boron-Doped Silicon Wafer using Rapid Thermal Diffusion, Book of Pre-Prints of the of 3rd International Conference on Materials for Microelectronics, 16-17 October 2000, Dublin Castle, Ireland, pp. 147-150.

40. M. Nolan, T.S. Perova, R.A. Moore C.E. Beitia, J.F. McGilp and HS Gamble, Characterisation Of Borosilicate Glass as a Dopant Source and its Application for Low-Doped Drain PMOS Devices, Book of Pre-Prints of the 3rd International Conference on Materials for Microelectronics, 16-17 October 2000, Dublin Castle, Ireland, pp.31-34.

41. G.G. Gorbunov, T.S. Perova, A.G. Seregin and R.A. Moore, Thin-Film Thickness Measurements using Additional Peaks in FTIR Transmission Interferograms, Book of Pre-Prints of the 3rd International Conference on Materials for Microelectronics, 16-17 October 2000, Dublin Castle, Ireland, pp.255-257.

42. G. Joyce, C. Moore, T.S. Perova, C. Beitia, A. Kocot, K. Berwick, R.A. Moore, H. Byrne and J.F. McGilp, Structural Properties and Stress Analysis of SiO2 Thin Films, Book of Pre-Prints of the 3rd International Conference on Materials for Microelectronics, 16-17 October 2000, Dublin Castle, Ireland, pp.251-254.

43. M. Nolan, T.S. Perova, R.A. Moore, C.E. Beitia, J.F. McGilp and H.S. Gamble, Spectroscopic investigations of borosilicate glass and its application as a dopant source for shallow junctions, J.Electrochem. Soc., 147, 3100-3105 (2000).

Conference Papers

1. P.W. Leech, T. Perova, R.A. Moore, G.K. Reeves, A.S. Holland, and M. Ridgway, C, Si and Sn Implantation of cvd diamond as a means of Enhancing Subsequent etch rate, Fall MRS Meeting, November, 2004, Boston.

2. K.Hosie, T. S. Perova, Y. Guníko, R. Blake, K. Berreth and R. A. Moore, Micro-Raman spectroscopy of nanostructured carbon materials, 7th International Conference on Nanostructured Materials. NANO-2004, Wiesbaden, Germany, June 20-24, Germany.

3. V.A. Tolmachev, E.V. Astrova J. Pilyugina, T. S. Perova, R.A. Moore, Design and fabrication of periodical structures based on grooved Si for infrared microphotonic, E-MRS Spring Meeting, 22-26 May, 2004, Strasbourg, France.

4. Vladimir A. Tolmachev, Ekaterina V. Astrova, T. S. Perova, Julia Pilyugina and R.A. Moore, Design and fabrication of periodical structures based grooved Si for infrared structures based on grooved Si for infrared microphotonics. Conference on Porous Silicon Ė Science and Technology, March 14-19, 2004, Gullera-Valencia, Spain. (Oral Presentation).

5. M. F. Bain, P. Baine, D. W. McNeill, G. Srinivasan, N. Yankovic, J. McCarthy, R.A. Moore, B. M. Armstrong and H. S. Gamble, Fabrication and Characterisation of SOI Substrates Incorporating Thermal Vias, NATO ARW: Science and Technology of Semiconductor On-insulator structures devices operating in a harsh environment, 25-29 April, 2004, Kyiv, Ukraine.

6. E.V. Astrova, T. Borovinskaya, V.A. Tolmachev, T.S. Perova, R.A. Moore, Stripes of 2D photonic crystals obtained from macro-porous silicon, E-MRS Spring Meeting, 22-26, 2004, May, Strasbourg, France.

7. J.McCarthy, S. Bhattacharya, T.S. Perova, R.A. Moore, F. Meyer, H. Gamble, and B. M. Armstrong, Composition and stress analysis in Si structures using micro-Raman spectroscopy, SPIE International Conference - Photonics Europe, 26-30 April 2004, Strasbourg France. (Accepted as an Oral Presentation).

8. S. Das, S. Chakraborty, S. Bhattacharya, M. Bain, J. McCarthy, B.M. Armstrong, H.S. Gamble, G.K. Dalapati, S.K. Samanta, T. Perova, R.A. Moore and C.K. Maiti, Rapid Thermal Oxidation of Strained-Ge Layers, IEEE 24th International Conference on Microelectronics (MIEL-2004), NIS, Serbia and Montenegro, 16-19 May 2004. (Oral presentation).

9. S. Bhattacharya, G.K. Dalapati, S. Das, S.K. Samanta, S. Chakraborty, J. McCarthy, B.M. Armstrong, H.S. Gamble, C.K. Maiti, T. Perova and R.A. Moore, Electrical Properties of High-k ZrO2 Gate Dielectrics on Strained-Ge Layers, IEEE 24th International Conference on Microelectronics (MIEL-2004), NIS, Serbia and Montenegro, 16-19 May 2004. (Poster).

10. S. Chakraborty, S.K. Samanta, S. Bhattacharya, J. McCarthy, B.M. Armstrong, H.S. Gamble, G.K. Dalapati, S. Das, T. Perova, R.A. Moore and C.K. Maiti, High-k Ta2O5 Gate Dielectrics on Strained-Ge Layers, IEEE 24th International Conference on Microelectronics (MIEL-2004), NIS, Serbia and Montenegro, 16-19 May 2004. (Poster).

11. L. Golovan, V. Timoshenko and P.K. Kashakarov, T.S. Perova, R.A. Moore, D. Fitzgerald, Polarized Raman spectroscopy of anisotropically nanostructured silicon, 4th International Conference on Porous Silicon Ė Science and Technology, March 14-19, 2004, Cullera-Valensia, Spain. (Poster).

12. S. Blakrishan, Y. Guníko, T. S. Perova, Aran Rafferty R.A. Moore, E.V. Astrova, porous silicon Ė Rare earth doped xerogel and glass composites, Conference on Porous Silicon Ė Science and Technology, March 14-19, 2004, Gullera-Valensia, Spain. (Accepted as a Poster).

13. Y. Guníko, T. S. Perova, S. Blakrishan, R.A. Moore and M Venkesan, Self-organisation of magnetite nanoparticles on silicon substrates, Conference on Porous Silicon Ė Science and Technology, March 14-19, 2004, Gullera-Valensia, Spain. (Accepted as a Poster).

14. K.Hosie, T. S. Perova, Y. Guníko, R. Blake, K. Berreth and R.A. Moore, Micro-Raman spectroscopy of nanostructured carbon materials, 1st International Nanofab-rication Symposium, Dundalk, Ireland, March 10-12, 2004 (Poster).

15. S. Bhattacharya, J. McCarthy, B. M. Armstrong, H. S. Gamble, C. K. Maiti, T. Perova and R.A. Moore, Deposition of Strained Ge Layers on Si1-xGex/Si Virtual Substrates, 4th International Conference on Computers and Devices for Communication, CODEC-04, January 1-3, 2004, Kolkata, India. (Oral Presentation).

16. S. Bhattacharya, J. McCarthy, S.K. Samanta, B.M. Armstrong, T. Perova, H.S. Gamble, C.K. Maiti, R.A. Moore, Growth and Characterisation of strained-Si Structures on Relaxed-SiGe for MOSFET applications, Conference in India.

17. S. Bhattacharya, S.K. Samanta, S. Chatterjee, J. McCarthy, B.M. Armstrong, H.S. Gamble, C.K. Maiti, T. Perova and R.A. Moore, Conduction Mechanism in High-k ZrO2 Gate Dielectric Films on strained-Ge Layers, 2003 International Semiconductor Device Research Symposium (ISDRS), December 10-12, 2003, University of Maryland, US. (Oral Presentation).

18. S. Bhattacharya, Samanta Santanu K. Chatterjee Somenath, J. McCarthy, B.M. Armstrong, H.S. Gamble, C.K. Maiti, T.S. Perova, R.A. Moore, High-k ZrO2 Gate dielectric on Strained-Si, MRS Fall Meeting, December 1-4, 2003, p. 131 (E3.22).

19. A. V. Baranov, D.V. Talapin, T. S. Perova, R.A. Moore, Yu. P. Rakovich, J. F. Donegan and A.L. Rogach, Interface effect on optical phonons in CdSe/ZnS Nanocrystals: Resonant Raman Spectroscopy, MRS Fall Meeting, Boston, November 30 ĖDecember 5, 2003, p. 380 (N11.5).

20. Sekhar Bhattacharya, S.K. Samanta, S. Chatterjee, McCarthy John, Armstrong B.M., Gamble H.S., Maiti C.K., Perova T.S., R.A. Moore, Fundamentals of Novel Oxide/Semiconductor Interfaces, MRS Fall Conference, November 2003.

21. A.V. Baranov, T.S. Perova, V. Yam, Vinh Le Thanh, Daniel Bouchier, S. Solosin and R.A. Moore, Polarised Raman Spectroscopy of Multilayered Ge/Si(001) Quantum Dot Heterostructures, E-MRS Spring Meeting, June 10-13, 2003, Strasbourg, France.

22. S. Bhattacharya, J. McCarthy, B.M. Armstrong, H.S. Gamble, G.K. Dalapati, S. Das, C.K. Maiti, T.S. Perova, R.A. Moore, Gate Dielectrics on Strained-Ge Layers on Si1-xGex/Si Virtual Substrates, International Workshop on Gate Insulator 2003, November 6-7, 2003, Tokyo, Japan.

23. S. Balakrishnan, A. Rafferty, T.S. Perova, and Y.K. Guníko and R.A. Moore "Investigations of rare earth doped nanocomposites of macro-porous silicon", Microscopical Society of Ireland - 27th Annual Symposium, 10-12 September 2003, Cork, Ireland. (Poster presentation).

24. S.Unnikrishnan, I.I. Shaganov, T.S. Perova, and R.A. Moore, Spectroscopic characteristics of nanocomposite structures in case of 3D, 2D and 1D size confinements, Irish Microscopical Society Conference, 4-6 September, 2003, Cork, Ireland. (Poster).

25. D. Fitzgerald, T.S. Perova, R.A. Moore, K. Lyutovich, M. Oehme, and E. Kasper, Strain, composition and crystalline disorder in thin SiGe layers studied by Raman spectroscopy, Irish Microscopical Society Conference, 4-6 September, 2003, Cork, Ireland. (Oral presentation).

26. J.McCarthy, S. Bhattacharya, T.S. Perova, R.A. Moore, F. Meyer, H. Gamble, and B. M. Armstrong, Composition and stress analysis in Si structures using micro-Raman spectroscopy, Irish Microscopical Society Conference, 4-6 September, 2003, Cork, Ireland. (Oral Presentation).

27. K.Hosie, T.S. Perova, R.A. Moore, E. Roos, K. Berreth and A. Lyutovich, Micro-Raman spectroscopy of protective coatings deposited onto C/C-SiC composites, Irish Microscopical Society Conference, 4-6 September, 2003, Cork, Ireland. (Oral Presentation).

28. R.A. Moore, S. Unnikrishnan, T.S. Perova, N.D. McMillan, S. Riedel, M. OíNeill and G. Doyle, Investigation of correlation between characteristics of Raman spectra and parameters of data-scattering obtained from phase coherence theory, Irish Microscopical Society Conference, 4-6 September, 2003, Cork, Ireland. (Oral Presentation).

29. A. V. Baranov, T. S. Perova, S. Solosin, R. A. Moore, V. Yam, V. Le Thanh, and D. Bouchier, Polarized Raman spectroscopy of single layer and multilayer Ge/Si(001) quantum dot heterostructures, NATO Advanced Research Workshop (ARW) Summer School, "Frontiers in Molecular-Scale Science and Technology of Nanocarbon, NanoSilicon and Biopolymer Multifunctional Nanosystems", 12-16 July 2003, Ilmenau, Germany. (Oral Presentation).

30. V. A. Tolmachev, T.S. Perova, E.V. Astrova and R.A. Moore, Photonic band gap structures based on periodically grooved silicon, 2nd European Symposium on Photonic Crystals: ESPC 2003, Warsaw, Poland, 29 June-3 July 2003. (Oral Presentation).

31. K. Maile, K. Berreth, A. Lyutovich, G. Zies, R. Weiss, T. Perova and R.A. Moore, Chemical Vapour Deposition of pyC-SixCy-SiC-Si3N4 Multilayer with Graded C...SiC Transition, E-MRS 2003 Spring Meeting, Symposium G, Protective Coatings and Thin Films-03, June 10-13, 2003, Strasbourg, France (Oral Presentation).

32. A.V. Baranov, T.S. Perova, V. Yam, Vinh Le Thanh, Daniel Bouchier, S. Solosin and R.A. Moore, Polarised Raman spectroscopy of multilayered Ge/Si(001) quantum dot heterostructures, E-MRS Spring Meeting, June 10-13, 2003, p. D/PIII.57, Strasbourg, France.

33. I. Shaganov, T.S. Perova, R.A. Moore and K. Berwick, The effect of the internal field dispersion on absorption spectra of micro-structural composites for the cases of 3D, 2D and 1D confinement, International Conference on Optics of Surfaces and Interfaces (OSI-V), Leon, Mexico 26-30 May, 2003 (Oral presentation).

34. Baranov, T. S. Perova, R.A. Moore, Yu. P. Rakovich, J. F. Donegan, and D. Talapin, Evolution of Optical Phonons in CdSe/ZnS Quantum Dots: Raman Spectroscopy, International Conference NANOMEETING-2003, 20-23 May 2003,BSUIR, Minsk,Beloruss (Oral presentation).

35. E.V.Astrova, T.S. Perova, V. Tolmachev, A.D. Remenyuk, J.K. Vij and R.A. Moore, Large Optical Anisotropy of 1-D Photonic Crystal Fabricated by Vertical Etching of Silicon, International Conference NANOMEETING-2003, 20-23 May 2003, BSUIR, Minsk, Beloruss (oral presentation).

36. Y. K. Guníko, T. S. Perova, S. Balakrishnan, D. A. Potapova, R.A. Moore and E. V. Astrova, Spectroscopic Characterisation of Chemically Modified Porous Silicon, SPIE Regional Meeting on Optoelectronics, Photonics and Imaging, Opto-Ireland 2002, 5-6 September, 2002, Galway, Ireland (Poster).

37. Tatiana Perova, Igor Shaganov, Kevin Berwick, Daria Potapova, Cormac Moore, and R.A. Moore, FTIR Reflection-Absorption Study of SiOx Dielectric Films, SPIE Regional Meeting on Optoelectronics, Photonics and Imaging, Opto-Ireland 2002, 5-6 September, 2002, Galway, Ireland (Poster).

38. T.S. Perova, K. Lyutovich, D. Potapova, C.P. Parry, E. Kasper and R.A. Moore, Strain and composition in thin SiGe buffer layers with high Ge content studied by micro-Raman spectroscopy, The 4th International Conference on Advanced Semiconductor Devices and Microsystems, Smolenice Castle, Slovakia, 14-16 October, 2002, p. 191 (Oral presentation).

39. John F. Donegan, Yury Rakovich, Lisong Yang, Eithne M. McCabe, Tania Perova and R.A. Moore, Whispering Gallery Mode Lasing from a Composite System of CdTe nanocrystals and a Spherical Microcavity, MRS 2002 Fall Meeting, Symposium E: Physics and Technology of Semiconductor Quantum Dots, Boston, 2002 (Poster). E13.14

40. T.S. Perova, F. Meyer, M. Hattab, D. Potapova, and R.A. Moore, Carbon Dependence of the Vibrational Modes Frequencies in Si1-x-yGexCy Alloys, SPIE Regional Meeting on Optoelectronics, Photonics and Imaging, Opto-Ireland 2002, 5-6 September, 2002, Galway, Ireland (Oral presentation).

41. T.S. Perova, R. Maurice, K. Lyutovich, M. Bauer, C. P. Parry, E. Kasper and R.A. Moore, Micro-Raman Investigations of Thin SiGe Buffer Layers with High Ge Content, 4th International Conference on Materials for Microelectronics, Helsinki, 10-12 June 2002, pp. 141-144.

42. T.S. Perova, Yu. Guníko, S. Balakrishnan, D. Potapova, R.A. Moore and E.V. Astrova, Chemical Modification of Silicon Surfaces for Integration of Molecular Electronics, Materials of 3rd International Conference on Porous Semiconductors Science and Technology, 11-15 March, 2002, Tenerife, Spain.(Oral presentation) pp. 113-114.

43. Igor Shaganov, Tatiana Perova, Kevin Berwick, and R.A. Moore, Local Field Effect on Infrared Phonon Frequencies of Thin Dielectric Films, SPIE Regional Meeting on Optoelectronics, Photonics and Imaging, Opto-Ireland 2002, 5-6 September, 2002, Galway, Ireland (Oral presentation).

44. T.S. Perova, K. Maile, A. Lyutovich, K. Berreth, D. Potapova, and R.A. Moore, Investigation into the Structure and Composition of Carbon/Carbon-SiC Composites, SPIE Regional Meeting on Optoelectronics, Photonics and Imaging, Opto-Ireland 2002, 5-6 September, 2002, Galway, Ireland (Poster).

45. Vladimir Tolmachev, Tatiana Perova, Jajgish Vij, Ekaterina Astrova, Kevin Berwick and R.A. Moore, FTIR and Raman investigation of vertically etched silicon as 1D photonic crystal, SPIE Regional Meeting on Optoelectronics, Photonics and Imaging, Opto-Ireland 2002, 5-6 September, 2002, Galway, Ireland. (oral presentation).

46. T.S. Perova, C. Moore, I. Shaganov, K. Berwick, D. Potapova and R.A. Moore, Study of Structure and Quality of Different Silicon Oxides by using FTIR and Raman microscopy, 4th International Conference on Materials for Microelectronics, Helsinki, 10-12 June 2002, pp. 303-306.

47. T.S. Perova, Yu. Guníko, S. Balakrishnan, D. Potapova, R.A. Moore and E.V. Astrova, Chemical Modification of Silicon Surfaces for Integration of Molecular Electronics, Materials of 3rd International Conference on Porous Semiconductors Science and Technology, 11-15 March, 2002, Tenerife, Spain.(Oral presentation) pp. 113-114.

48. T.S. Perova, E.V.Astrova, D. Potapova, T.N. Vasunkina, and R.A. Moore, Stress analysis in macro-porous silicon using micro-Raman spectroscopy, Materials of 3rd International Conference on Porous Semiconductors Science and Technology, 11-15 March 2002, Tenerife, Spain. (Poster), pp. 181-182.

49. T.S. Perova, R.A. Moore, M. Nolan, and H.S. Gamble, Spectroscopic Investigation of Borosilicate Glass as a Dopant Source for Shallow Junctions, Proceedings of the International Conference on Advanced Spectroscopy, ICAVS-1, Turku, 19-24 August, 2001, Finland, P20.257.

50. I. Shaganov, T.S. Perova, R.A. Moore and K. Berwick, The Influence of Local Field Effect on Spectroscopic Characteristics of Thin Solid Films, Proceedings of the International Conference on Advanced Spectroscopy, ICAVS-1, Turku, 19-24 August, 2001, Finland, P18.231.

51. P.C. Fannin, T.S. Perova, M. Nolan, T.Giannitis, R.A. Moore and H.S. Gamble, Dielectric properties of Thin Solid Films Formed on Silicon, The 3rd International Conference on Materials for Electronics, 16-17 October 2000, Dublin, Ireland.

52. M. Nolan, D. Lowney, P. J. McNally, T.S. Perova, R.A. Moore, H. Gamble, T. Tuomi, R. Rantamaki and A.N. Danilewsky, Synchrotron X-Ray Topography and Micro-Raman Spectroscopy of Boron-Doped Silicon Wafer using Rapid Thermal Diffusion, The 3rd International Conference on Materials for Electronics, 16-17 October 2000, Dublin, Ireland.

53. G. Joyce, C. Moore, T.S. Perova, C. Beitia, A. Kocot, K. Berwick, R.A. Moore, H. Byrne and J.F. McGilp, Structural Properties and Stress Analysis of SiO2 Thin Films, The 3rd International Conference on Materials for Electronics, 16-17 October 2000, Dublin, Ireland.

54. G.G. Gorbunov, T.S. Perova, A.G. Seregin and R.A. Moore, Thin-film Thickness Measurements using Additional Peaks in FTIR Transmission Interferogram, The 3rd International Conference on Materials for Electronics, 16-17 October 2000, Dublin, Ireland.

55. M. Nolan, T.S. Perova, R.A. Moore, H. Gamble, D. Lowney, P. J. McNally, T. Tuomi, R. Rantamaki and A.N. Danilewsky, Micro-Raman and Synchrotron X-Ray Topography of Boron-Doped Silicon Wafer using Rapid Thermal Diffusion, The XVIIth International Conference on Raman Spectroscopy, ICSF 2000, Xeimen, China, August 17-20, 2000.

56. M. Nolan, T.S. Perova, C.E.Beitia, R.A. Moore, J. McGilp, H.S. Gamble, C. Moore and K. Berwick, Spectroscopic Investigations of Dopant-source Borosilicate glass for Integrated Circuits, NATO/EC Advanced Workshop (ARW)/Spring School ĎFrontiers of Nano-Optoelectronic Systems: Molecular-Scale Engineering and Processesí, SA (PST.ARW 975678) 5068, Kyiv, Ukraine, 22-26th May, 2000, NMSC-4.

57. M. Nolan, T.S. Perova, C.E.Beitia, R.A. Moore, J. McGilp, H.S. Gamble, C. Moore and K. Berwick, Spectroscopic Investigations of Dopant-source Borosilicate Glass, The Electrochemical Society 197th Meeting, Toronto, Ontario, Canada, May 14-18, 2000.

58. T.A. Briantseva, Z.N. Lebedeva, D.V. Lioubtchenko, M. Nolan, T.S. Perova, R.A. Moore and H.S. Gamble, Process-induced Modification to the Surface of Crystalline Silicon Measured by Precise Chemical Analysis, Proceedings of the EUROMAT Meeting, 26-30 September 2000, Munich, Germany.

59. G.G. Gorbunov, T.S. Perova, A.G. Seregin and R.A. Moore, Thin filmís thickness measurements using additional peaks in FTIR transmission interferogram, The 3rd International conference on Materials for Electronics, 16-17 October 2000, Dublin, Ireland.

 

Home | Research | People | Collaboration | Laboratory | Facilities | Educational Activities

 

Contact Us | EEE Home