Publications

Double-Tip Artifact Removal From Atomic Force Microscopy Images. Y. F. Wang, J. I. Kilpatrick, S. P. Jarvis, F. M. Frank Boland, A. Kokaram and D. Corrigan (2016) IEEE Transactions on Image Processing, 25(6):2774-2788. #7412740Bib

Bibtex entry

@ARTICLE { 7412740,
    AUTHOR = { Y. F. Wang and J. I. Kilpatrick and S. P. Jarvis and F. M. Frank Boland and A. Kokaram and D. Corrigan },
    JOURNAL = { IEEE Transactions on Image Processing },
    TITLE = { Double-Tip Artifact Removal From Atomic Force Microscopy Images },
    YEAR = { 2016 },
    VOLUME = { 25 },
    NUMBER = { 6 },
    PAGES = { 2774-2788 },
    DOI = { 10.1109/TIP.2016.2532239 },
    ISSN = { 1057-7149 },
    MONTH = { June },
}

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